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Kitatsuji, Yoshihiro; Yoshida, Zenko; Kudo, Hiroshi*; Kihara, Sorin*
Analytical Sciences (CD-ROM), 17(Suppl.), p.329 - 331, 2002/03
no abstracts in English
; ; ; Ikeda, Hisashi ; Jitsukata, Shu*; *
JNC TN8410 2000-022, 55 Pages, 2000/05
Measurement of U and Pu concentrations by wavelength dispersion type X-ray fluorescence spectrometry was studied. Sample holder was installed inside of glove box and other instruments, X-ray tube, monochromator and detectors were set out side of the glove box. X-rays was irradiated to sample though Be window. Fluorescent X-rays form sample were also passing though the same Be window and detected outside. Analytical conditions were optimized as follows. Sample thickness is 8 mm, which is 3ml of sample volume by the sample holder. Voltage and eurrent for X-ray tube is 50kV and 40 mA, respectively. Measurement was done twice, 60 seconds each, and averaged X-ray intensity was used to calculate elemental concentrations. Matrix correction was necessary to measure U and Pu concentration within 10% accuracy. Detection limits were calculated to 0.4 mg/L for U and 0.7mg/L for Pu. Calibration curve was liner up to 9 g/L fbr U and Pu. Two calculation methods, calibration curve method and standard addition method, were studied to measure Pu concentration in organic solution. Detection limit was 5.3 mg/L and 0.2 mg/L, respectively.
Kitatsuji, Yoshihiro; Aoyagi, Hisao; Yoshida, Zenko; Kihara, Sorin*
Analytical Sciences, 14, p.67 - 70, 1998/02
Times Cited Count:11 Percentile:38.78(Chemistry, Analytical)no abstracts in English
; Suzuki, Shinichi; Abe, Hitoshi; Tachimori, Shoichi
JAERI-M 93-014, 40 Pages, 1993/02
no abstracts in English
;
Talanta, 31(10A), p.789 - 797, 1984/00
no abstracts in English